The ESRF Experimental Techniques Ontology
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The ESRF Experimental Techniques Ontology

Release: 2025-07-07

Modified on: 2025-09-06
This version:
https://w3id.org/PaN/ESRFET/v0.1.0
Revision:
v0.1.0
Authors:
Giannis Koumoutsos✉
Wout De Nolf, ESRF✉
Contributors:
Ludovic Broche, ESRF✉
Marjolaine Bodin Ligeon, ESRF✉
Pierre-Olivier Autran, ESRF✉
Imported Ontologies:
PaNET.owl
Download serialization:
JSON-LD RDF/XML N-Triples TTL
License:
http://creativecommons.org/licenses/by/4.0/
Visualization:
Visualize with WebVowl
Cite as:
Giannis Koumoutsos, Wout De Nolf. The ESRF Experimental Techniques Ontology. Revision: v0.1.0. Retrieved from: https://w3id.org/PaN/ESRFET/v0.1.0
Provenance of this page
Ontology Specification Draft

Abstract

The ESRFET ontology describes beamline experimental techniques at ESRF to enhance the FAIRness of experimental metadata. It supports semantic interoperability and reasoning over relationships between techniques.

Introduction back to ToC

This is a place holder text for the introduction. The introduction should briefly describe the ontology, its motivation, state of the art and goals.

The ESRF Experimental Techniques Ontology: Overview back to ToC

This ontology has the following classes and properties.

Classes

Object Properties

Data Properties

Annotation Properties

Named Individuals

The ESRF Experimental Techniques Ontology: Description back to ToC

The ESRF Ontologies project provides ontologies related to ESRF data acquisition.

Cross-reference for The ESRF Experimental Techniques Ontology classes, object properties and data properties back to ToC

This section provides details for each class and property defined by The ESRF Experimental Techniques Ontology.

Classes

3DXRDc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#3DXRD

3DXRD is a far field diffraction technique capable of reconstructing polycrystalline materials from the individual diffraction spots recorded in the diffraction pattern given that the crystallographic parameters of the material are known. The success of the technique is based on the ability of the individual diffraction spots to be separated. This means there is a trade off between the number of grains and the degree of strain that is measurable.
is equivalent to
experimental technique c and (measures as a function of op some tomography c) and (measures result of interaction op some diffraction of elastic scattering c) and (requires sample input op some x ray c) and (requires sample type op some polycrystalline sample c)

absorptionc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#absorption

is equivalent to
atomic core excitation c
has super-classes
cascade of events being detected c

ambient temperaturec back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#ambient_temperature

Reference: 20–25 °C
has super-classes
sample temperature c

analyzer crystalc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#analyzer_crystal

Detect photons with an analyzer crystal set at the Bragg diffraction condition which reduces the angular and energy spread of the photons before they reach the detector.
has super-classes
detector type c

area detectorc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#area_detector

Detector that distinguishes the position of the waves (photons or particles) in a 2D plane in space by using an array of pixels which measure the waves independently.
has super-classes
detector type c

ARPESc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#ARPES

Angle-Resolved Photoemission Spectroscopy (ARPES) measures the energy and momentum of electrons emitted from a sample when illuminated by photons, mapping the electronic band structure and Fermi surface of materials.
has super-classes
experimental technique c

atmospheric pressurec back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#atmospheric_pressure

~1 × 10⁵ Pa (101 325 Pa)
has super-classes
sample pressure c

atomic core excitationc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#atomic_core_excitation

Detecting any of the results after atomic core excitation (fluorescence, photo-electrons or auger-electrons)
has super-classes
cascade of events being detected c

auger electronsc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#auger_electrons

Detecting one result after atomic core excitation (auger electrons)
has super-classes
cascade of events being detected c

BCDIc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#BCDI

Bragg Coherent Diffraction Imaging (BCDI) measures the coherent diffraction around a Bragg peak from a crystalline sample to reconstruct the 3D shape and internal strain field of individual nanocrystals. The result is a high-resolution image of the crystalline structure and deformation.
has super-classes
experimental technique c

biological samplec back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#biological_sample

Any material taken from a living organism or made of biological molecules, such as cells, tissues, membranes, proteins, nucleic acid, DNA, or viruses
has super-classes
sample type c

BioSAXSc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#BioSAXS

BioSAXS is SAXS applied to biological macromolecules in solution to determine their size, shape, flexibility, and aggregation state in near-native conditions.
is equivalent to
experimental technique c and (measures interaction result property op some large length scales c) and (measures result of interaction op some diffraction of elastic scattering c) and (requires sample input op some x ray c) and (requires sample type op some biological sample c)

cascade of events being detectedc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#cascade_of_events_being_detected

The interaction between the sample and sample input(s) leads to a cascade of events, the result of which is being detected.
has super-classes
technique property c
has sub-classes
absorption c, atomic core excitation c, auger electrons c, diffraction c, diffusion c, fluorescence c, photo electrons c, reflection c, refraction c, total electrons c, transmission c
is in range of
measures result of interaction op
is disjoint with
detected cascade of events property c, detector type c, sample input c, sample input property c, sample type c, space time c

CDIc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#CDI

Coherent Diffraction Imaging (CDI) measures the far-field diffraction pattern from a sample illuminated with a coherent X-ray beam. The image of the sample is reconstructed computationally from the diffraction data using phase retrieval algorithms, yielding high-resolution, lensless imaging of the electron density or scattering potential.
has super-classes
experimental technique c

charged particlesc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#charged_particles

For example protons or helium ions
has super-classes
sample input c

chemical solutionc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#chemical_solution

A homogeneous mixture of solutes dissolved in a solvent.
has super-classes
sample type c

CMSc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#CMS

Conventional Mössbauer Spectroscopy measures the resonant absorption of X-rays by Mössbauer-active nuclei (e.g. Fe-57) using a radioactive source scanned in velocity. It provides information on oxidation state, magnetic ordering, and local electronic and structural environment through hyperfine interactions.
has super-classes
experimental technique c

CRYO-EMc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#CRYO-EM

Cryo-Electron Microscopy (Cryo-EM) measures phase shifts in electron waves transmitted through cryogenically preserved samples, producing high-contrast 2D images of biological macromolecules or soft materials at near-atomic resolution. Similar to serial crystallography, it reconstructs 3D structures from many randomly oriented single-particle images of identical molecules.
is equivalent to
experimental technique c and (measures as a function of op some detection as a function of limited number of sample to detector distance c) and (measures as a function of op some serial screening c) and (measures as a function of op some tomography c) and (measures result of interaction op some refraction c) and (measures result of interaction op some transmission c) and (requires sample input op some electrons c) and (requires sample input property op some cryogenic temperature c)

CRYO-ETc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#CRYO-ET

Cryo-Electron Tomography (Cryo-ET) measures phase shifts in transmitted electrons from multiple tilt angles of a cryogenically preserved sample to reconstruct 3D structures of cells or macromolecular assemblies with enhanced contrast and nanometer resolution.
is equivalent to
experimental technique c and (measures as a function of op some detection as a function of limited number of sample to detector distance c) and (measures as a function of op some individual specimen c) and (measures as a function of op some tomography c) and (measures result of interaction op some refraction c) and (measures result of interaction op some transmission c) and (requires sample input op some electrons c) and (requires sample input property op some cryogenic temperature c)

cryogenic temperaturec back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#cryogenic_temperature

1 - 77 K
has super-classes
sample temperature c

CTc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#CT

Computed Tomography (CT) measures projections of radiation (such as X-rays, electrons, or neutrons) through a sample from multiple angles and reconstructs 3D internal maps of material properties, providing structural information whose contrast depends on the measured interaction (e.g., absorption, phase, fluorescence, or diffraction).
is equivalent to
experimental technique c and (measures as a function of op some tomography c)

CXDIc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#CXDI

Coherent X-ray Diffraction Imaging (CXDI) measures the coherent X-ray diffraction pattern from an isolated object or nanostructure. The 3D electron density is reconstructed computationally using phase retrieval, providing high-resolution, lensless imaging of the sample's internal structure.
has super-classes
experimental technique c

D A Cc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#DAC

Diamond Anvil Cell to apply pressure on the sample
has super-classes
sample input c

DAFSc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#DAFS

Diffraction Anomalous Fine Structure (DAFS) measures the intensity of Bragg diffraction as a function of X-ray photon energy near an absorption edge. It combines diffraction and XAS to provide element-specific structural information, such as site occupancy, bonding environment, and local distortions in crystals.
has super-classes
experimental technique c

DCTc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#DCT

DCT is a near-field diffraction-based imaging technique that provides high-resolution grain maps of polycrystalline materials (Ludwig et al. 2008). For each individual grain, the technique can provide orientation and average elastic strain tensor components with an accuracy of a few times 1e-4 (Reischig et al. 2013). The technique combines the concepts of image reconstruction from projections (tomography) and X-ray diffraction imaging (topography).
is equivalent to
experimental technique c and (measures as a function of op some tomography c) and (measures result of interaction op some diffraction of elastic scattering c) and (measures result of interaction op some measures transmission with detector type op some area detector c) and (requires sample input op some x ray c) and (requires sample type op some polycrystalline sample c)

detected cascade of events propertyc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#detected_cascade_of_events_property

The interaction between the sample and sample input(s) leads to a cascade of events, the result has properties which are being detected.
has super-classes
technique property c
has sub-classes
detected photon property c, detection resolution c
is in range of
measures interaction result property op
is disjoint with
cascade of events being detected c, detector type c, sample input c, sample input property c, sample type c, space time c

detected photon propertyc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#detected_photon_property

The interaction between the sample and sample input(s) leads to a cascade of events, the result being photons which properties are being measured.
has super-classes
detected cascade of events property c
has sub-classes
photon count c, photon direction with respect to primary beam c, photon energy c, polarization c

detection as a function of incident energyc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#detection_as_a_function_of_incident_energy

Detect as a function of the incident photon or particle energy
has super-classes
space time c
has sub-classes
detection as a function of limited number of incident energies c, extended c, near edge c

detection as a function of limited number of incident energiesc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#detection_as_a_function_of_limited_number_of_incident_energies

has super-classes
detection as a function of incident energy c

detection as a function of limited number of sample to detector distancec back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#detection_as_a_function_of_limited_number_of_sample_to_detector_distance

has super-classes
detection as a function of sample to detector distance c

detection as a function of sample to detector distancec back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#detection_as_a_function_of_sample_to_detector_distance

has super-classes
space time c
has sub-classes
detection as a function of limited number of sample to detector distance c

detection as a function of timec back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#detection_as_a_function_of_time

Used to describe techniques that involve time-resolved measurements
has super-classes
space time c

detection resolutionc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#detection_resolution

The interaction between the sample and sample input(s) leads to a cascade of events, the resolution of the certain result properties are measured.
has super-classes
detected cascade of events property c
has sub-classes
high angular resolution c, high precision in Q space c, large length scales c, small length scales c, ultra large length scales c

detector typec back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#detector_type

The interaction between the sample and sample input(s) leads to a cascade of events, the result has properties which are being detected with a detector that has certain characteristics.
has super-classes
technique property c
has sub-classes
analyzer crystal c, area detector c, energy dispersive detector c, point detector c, strip detector c, wavelength dispersive detector c
is in range of
measures transmission with detector type op, measures with a detector type op
is disjoint with
cascade of events being detected c, detected cascade of events property c, sample input c, sample input property c, sample type c, space time c

DFXMc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#DFXM

Dark-Field X-ray Microscopy (DFXM) measures X-ray diffraction in a dark-field imaging geometry to map crystalline structure, orientation, strain, and defects in 3D within bulk materials. It provides spatially resolved imaging of internal microstructures at micrometer to sub-micrometer resolution.
has super-classes
experimental technique c

diffractionc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#diffraction

Detecting interference of elastically scattering photons or particles
has super-classes
cascade of events being detected c
has sub-classes
diffraction of elastic scattering c

diffraction of elastic scatteringc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#diffraction_of_elastic_scattering

has super-classes
diffraction c

diffusionc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#diffusion

Also referred to as "dark-field".
has super-classes
cascade of events being detected c

disperse incident energy in spacec back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#disperse_incident_energy_in_space

Disperse incident wave photons in space with a polychromator (e.g. elliptically curved crystal in Bragg or Laue geometry).
has super-classes
sample input property c

ED-EXAFSc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#ED-EXAFS

Energy Dispersive Extended X-ray Absorption Fine Structure (ED-EXAFS) measures oscillations in X-ray absorption probability beyond the edge with energy-dispersive detection, providing local atomic structural information such as bond distances and coordination numbers, acquired quickly without angular scanning.
is equivalent to
experimental technique c and (measures as a function of op some extended c) and (measures interaction result property op some photon count c) and (measures result of interaction op some atomic core excitation c) and (requires sample input op some x ray c) and (requires sample input property op some disperse incident energy in space c)

ED-XANESc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#ED-XANES

Energy Dispersive X-ray Absorption Near Edge Structure (ED-XANES) measures the X-ray absorption probability near the absorption edge using energy-dispersive detection, providing rapid information about the oxidation state and electronic structure without scanning incident energy.
is equivalent to
experimental technique c and (measures as a function of op some near edge c) and (measures interaction result property op some photon count c) and (measures result of interaction op some atomic core excitation c) and (requires sample input op some x ray c) and (requires sample input property op some disperse incident energy in space c)

ED-XASc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#ED-XAS

Energy Dispersive X-ray Absorption Spectroscopy (ED-XAS) measures X-ray absorption as a function of energy simultaneously by dispersing the X-ray beam in space with a polychromatic source and position-sensitive detector, enabling rapid acquisition of absorption spectra without scanning the incident energy.
is equivalent to
experimental technique c and (measures as a function of op some detection as a function of incident energy c) and (measures interaction result property op some photon count c) and (measures result of interaction op some atomic core excitation c) and (requires sample input op some x ray c) and (requires sample input property op some disperse incident energy in space c)

ED-XRDc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#ED-XRD

Energy Dispersive X-ray Diffraction (ED-XRD) measures diffraction patterns of a sample by detecting diffracted X-rays at a fixed angle while dispersing their energies, enabling fast phase identification and structural analysis without angular scanning.
is equivalent to
experimental technique c and (measures interaction result property op some photon energy c) and (measures result of interaction op some diffraction of elastic scattering c) and (measures with a detector type op some energy dispersive detector c) and (requires sample input op some x ray c)

ED-XRFc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#ED-XRF

Energy Dispersive X-ray Fluorescence Spectroscopy (ED-XRF) measures the energies of fluorescent X-rays emitted by a sample excited by a broad-spectrum X-ray source, providing elemental composition analysis without scanning the incident energy.
is equivalent to
experimental technique c and (measures interaction result property op some photon count c) and (measures interaction result property op some photon energy c) and (measures result of interaction op some fluorescence c) and (measures with a detector type op some energy dispersive detector c) and (requires sample input op some x ray c)

ED-XRPDc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#ED-XRPD

Energy Dispersive X-ray Powder Diffraction (ED-XRPD) measures diffraction patterns of powdered samples by detecting diffracted X-rays at a fixed angle while varying their energy, enabling rapid phase identification and structural analysis without scanning angles.
is equivalent to
experimental technique c and (measures interaction result property op some photon energy c) and (measures result of interaction op some diffraction of elastic scattering c) and (measures with a detector type op some energy dispersive detector c) and (requires sample input op some x ray c) and (requires sample type op some powder sample c)

EDSc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#EDS

EDS measures X-ray photons coming from a sample during electron irradition with an energy dispersive detector and derives elemental composition from the energy of the fluorescence photons
is equivalent to
experimental technique c and (measures interaction result property op some photon count c) and (measures interaction result property op some photon energy c) and (measures result of interaction op some fluorescence c) and (measures with a detector type op some energy dispersive detector c) and (requires sample input op some electrons c)

electronsc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#electrons

has super-classes
sample input c

EMc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#EM

Electron Microscopy (EM) uses a beam of electrons as illumination, controlled by electron optics analogous to glass lenses in light microscopes, to measure electron scattering or transmission through a sample. This technique provides high-resolution images and electron diffraction patterns, revealing structural, morphological, and compositional information at nanometer to atomic scales.
is equivalent to
experimental technique c and (requires sample input op some electrons c)

energy dispersive detectorc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#energy_dispersive_detector

Detector that distinguishes the energy of the waves (photons or particles) it measures with a semiconductor material which seperates energies based on the electrical current they generate in the semiconductor material.
has super-classes
detector type c

EXAFSc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#EXAFS

Extended X-ray Absorption Fine Structure (EXAFS) measures oscillations in X-ray absorption above an element’s absorption edge, providing information on the local atomic environment, including distances, coordination numbers, and disorder around the absorbing atoms.
is equivalent to
experimental technique c and (measures as a function of op some extended c) and (measures interaction result property op some photon count c) and (measures result of interaction op some atomic core excitation c) and (requires sample input op some x ray c)

experimental techniquec back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#experimental_technique

A specific method or procedure used to perform experiments and gather data to investigate scientific questions.
has sub-classes
ARPES c, BCDI c, CDI c, CMS c, CXDI c, DAFS c, DFXM c, FPDI c, HAXPES c, HP-XRD c, HT-XRD c, IXS c, MAD c, MBS c, MPES c, MRT c, MX c, NFP c, NFS c, NR-XMLD c, NRIXS c, NRS c, PDF c, PTYCHO c, PXCT c, REXS c, RIXS c, RXES c, S-XEOL c, S-XRD c, SAD c, SMS c, SMX c, STXM c, TR-MX c, TR-SSX c, TR-USAXS c, TR-XRD c, USA-XPCS c, XBH c, XDMR c, XDS c, XEOL c, XES c, XFH c, XGI c, XLD c, XMCD c, XMLD c, XMχD c, XNCD c, XPCI c, XPCS c, XPS c, XRAYS c, XRPD c, XRS c, XRT c
is in domain of
measures as a function of op, measures interaction result property op, measures result of interaction op, measures with a detector type op, requires sample input op, requires sample input property op, requires sample type op

extendedc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#extended

Incident energy is scanned over a range > 200 eV
has super-classes
detection as a function of incident energy c

extreme high vacuumc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#extreme_high_vacuum

< 1 × 10⁻¹⁰ Pa
has super-classes
sample pressure c

extreme pressurec back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#extreme_pressure

> 1 × 10¹¹ Pa
has super-classes
sample pressure c

extreme temperaturec back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#extreme_temperature

5,000 – 10⁷ K
has super-classes
sample temperature c

FF-EXAFSc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#FF-EXAFS

FF-EXAFS measures the extended region of the absorption spectrum across a 2D sample area using broad X-ray beam and an area detector, providing spatially resolved information on local atomic structure, such as bond lengths and coordination.
is equivalent to
experimental technique c and (measures as a function of op some extended c) and (measures as a function of op some full field imaging c) and (measures interaction result property op some photon count c) and (measures result of interaction op some atomic core excitation c) and (requires sample input op some x ray c)

FF-XANESc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#FF-XANES

FF-XANES measures the near-edge region of the absorption spectrum across a 2D sample area using broad X-ray beam and an area detector, providing spatially resolved information on chemical state and electronic structure.
is equivalent to
experimental technique c and (measures as a function of op some full field imaging c) and (measures as a function of op some near edge c) and (measures interaction result property op some photon count c) and (measures result of interaction op some atomic core excitation c) and (requires sample input op some x ray c)

FF-XASc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#FF-XAS

FF-XAS measures X-ray absorption spectra across a 2D sample area using broad X-ray beam and an area detector, providing spatially resolved insight into electronic and atomic structure.
is equivalent to
experimental technique c and (measures as a function of op some detection as a function of incident energy c) and (measures as a function of op some full field imaging c) and (measures interaction result property op some photon count c) and (measures result of interaction op some atomic core excitation c) and (requires sample input op some x ray c)

FF-XRFc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#FF-XRF

FF-XRF measures X-ray fluorescence spectra across a 2D sample area using broad X-ray beam and an area detector, providing 2D elemental distribution maps in projection.
is equivalent to
experimental technique c and (measures as a function of op some full field imaging c) and (measures interaction result property op some photon count c) and (measures interaction result property op some photon energy c) and (measures result of interaction op some fluorescence c) and (measures with a detector type op some area detector c) and (requires sample input op some x ray c)

fluorescencec back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#fluorescence

Detecting one result after atomic core excitation (fluorescence)
has super-classes
cascade of events being detected c

FPDIc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#FPDI

Fabry-Pérot displacement interferometry (FPDI) measures minute changes in position by tracking shifts in the resonant frequencies of an optical cavity formed by two reflective surfaces. This technique provides sub-nanometer accuracy and resolution for dynamic displacement metrology.
has super-classes
experimental technique c

FS-EXAFSc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#FS-EXAFS

FS-EXAFS measures the extended region of the absorption spectrum across a 2D sample area using a focused X-ray beam, providing spatially resolved information on local atomic structure, such as bond lengths and coordination.
is equivalent to
experimental technique c and (measures as a function of op some extended c) and (measures as a function of op some scanning imaging c) and (measures interaction result property op some photon count c) and (measures result of interaction op some atomic core excitation c) and (requires sample input op some x ray c)

FS-XANESc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#FS-XANES

FS-XANES measures the near-edge region of the absorption spectrum across a 2D sample area using a focused X-ray beam, providing spatially resolved information on chemical state and electronic structure.
is equivalent to
experimental technique c and (measures as a function of op some near edge c) and (measures as a function of op some scanning imaging c) and (measures interaction result property op some photon count c) and (measures result of interaction op some atomic core excitation c) and (requires sample input op some x ray c)

FS-XASc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#FS-XAS

FS-XAS measures X-ray absorption spectra across a 2D sample area using a focused X-ray beam, providing spatially resolved insight into electronic and atomic structure.
is equivalent to
experimental technique c and (measures as a function of op some detection as a function of incident energy c) and (measures as a function of op some scanning imaging c) and (measures interaction result property op some photon count c) and (measures result of interaction op some atomic core excitation c) and (requires sample input op some x ray c)

FTIRc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#FTIR

Fourier Transform Infrared Spectroscopy (FTIR) measures the absorption of infrared light by a sample as a function of wavelength, providing information on molecular vibrations and chemical bonds to identify and characterize materials.
is equivalent to
experimental technique c and (measures result of interaction op some transmission c) and (requires sample input op some infrared c)

full field imagingc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#full-field_imaging

Image of the sample in a single measurement (no motion of beam, sample or detector)
has super-classes
imaging c

GISAXSc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#GISAXS

Grazing-Incidence Small-Angle X-ray Scattering (GISAXS) measures scattered X-rays at small angles from a sample surface under shallow incidence, providing nanoscale information about thin film and surface morphology, including size, shape, and arrangement of nanostructures.
is equivalent to
experimental technique c and (measures interaction result property op some large length scales c) and (measures result of interaction op some diffraction of elastic scattering c) and (requires sample input op some x ray c) and (requires sample input property op some sample incident angle smaller than critical angle c)

GIWAXSc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#GIWAXS

Grazing-Incidence Wide-Angle X-ray Scattering (GIWAXS) measures scattered X-rays at wide angles under shallow incidence, providing information on molecular packing, crystalline order, and orientation in thin films and surfaces.
is equivalent to
experimental technique c and (measures interaction result property op some small length scales c) and (measures result of interaction op some diffraction of elastic scattering c) and (requires sample input op some x ray c) and (requires sample input property op some sample incident angle smaller than critical angle c)

GIXRDc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#GIXRD

Grazing-Incidence X-ray Diffraction (GIXRD) measures diffraction patterns from a sample surface using X-rays at shallow incident angles, providing structural information on thin films, surfaces, and near-surface regions, including phase composition and strain.
is equivalent to
experimental technique c and (measures result of interaction op some diffraction of elastic scattering c) and (requires sample input op some x ray c) and (requires sample input property op some sample incident angle smaller than critical angle c)

gratingc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#grating

X-ray beam goes through an absorbing periodic structured material.
has super-classes
primary beam modification c

hard x rayc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#hard_x-ray

Defined using an object property (has_photon_energy_range) to connect to another class (photon_energy_range) that has the data properties (value and unit). It creates a chain where the characteristics of other classes included in the definition define the class. Works with the reasoner!
has super-classes
named photon energy ranges c

HAXPESc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#HAXPES

Hard X-ray Photoelectron Spectroscopy (HAXPES) uses high-energy X-rays to probe deeper into materials than conventional XPS, giving bulk-sensitive chemical and electronic information.
has super-classes
experimental technique c

HERFD-XASc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#HERFD-XAS

High-Energy Resolution Fluorescence Detected X-ray Absorption Spectroscopy (HERFD-XAS) measures X-ray absorption using fluorescence detected with high energy resolution, enhancing spectral detail by reducing core-hole lifetime broadening to reveal subtle electronic and chemical state information.
is equivalent to
experimental technique c and (measures as a function of op some detection as a function of incident energy c) and (measures interaction result property op some photon count c) and (measures result of interaction op some atomic core excitation c) and (measures result of interaction op some fluorescence c) and (requires sample input op some x ray c)

high angular resolutionc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#high_angular_resolution

For example min(ΔQ) = 1e-4 Å-1 to 5e-4 Å-1 Angular resolution: min(Δ2θ) = 0.001° to 0.005° Resolving power (Δ2θ/2θ)
is equivalent to
high precision in Q space c
has super-classes
detection resolution c

high precision in Q spacec back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#high_precision_in_Q_space

Deprecated as a relative resolution in scattering angle is a more common way, in which can we talk about angles and not Q which should be reflected in the name of the property.
has super-classes
detection resolution c

high pressurec back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#high_pressure

1 × 10⁷ – 1 × 10⁹ Pa
has super-classes
sample pressure c

high temperaturec back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#high_temperature

1,000 – 2,000 K
has super-classes
sample temperature c

high vacuumc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#high_vacuum

1 × 10⁻⁷ – 1 × 10⁻³ Pa
has super-classes
sample pressure c

HiP-CTc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#HiP-CT

Hierarchical Phase-Contrast Tomography (HiP-CT) measures X-ray phase-contrast projections at multiple spatial resolutions to reconstruct 3D images spanning from macroscopic to microscopic scales, enabling multiscale analysis of complex internal structures.
is equivalent to
experimental technique c and (measures as a function of op some multi sample spatial resolution c) and (measures as a function of op some tomography c) and (measures result of interaction op some refraction c) and (measures result of interaction op some transmission c) and (requires sample input op some x ray c)

horizontal linear polarizationc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#horizontal_linear_polarization

has super-classes
polarization c

HP-XRDc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#HP-XRD

High-Pressure X-ray Diffraction (HP-XRD) measures X-ray diffraction patterns of materials compressed to high pressures, revealing structural changes such as phase transitions, lattice compression, and equation-of-state behavior.
is equivalent to
experimental technique c and (measures result of interaction op some diffraction of elastic scattering c) and (requires sample input op some x ray c) and (requires sample input property op some high pressure c)
has super-classes
experimental technique c

HR-XRPDc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#HR-XRPD

High-Resolution X-ray Powder Diffraction (HR-XRPD) measures diffraction patterns from powdered samples with enhanced angular resolution and accuracy provided by an analyzer crystal, enabling precise phase identification, accurate lattice parameter determination, and detailed structural analysis of complex materials.
is equivalent to
experimental technique c and (measures interaction result property op some high angular resolution c) and (measures result of interaction op some diffraction of elastic scattering c) and (measures with a detector type op some analyzer crystal c) and (requires sample input op some x ray c) and (requires sample type op some powder sample c)

HT-XRDc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#HT-XRD

High-Temperature X-ray Diffraction (HT-XRD) measures X-ray diffraction patterns of materials at elevated temperatures, providing insights into thermal expansion, phase stability, and temperature-induced structural transformations.
is equivalent to
experimental technique c and (measures result of interaction op some diffraction of elastic scattering c) and (requires sample input op some x ray c) and (requires sample input property op some high temperature c)
has super-classes
experimental technique c

imagingc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#imaging

has super-classes
space time c
has sub-classes
full field imaging c, scanning imaging c

individual specimenc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#individual_specimen

A method of data collection where measuring one sample providse enough data that can be analyzed. You don't necessarily need many. Although might still do it for static purposes (e.g. measuring several lungs).
has super-classes
space time c

infraredc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#infrared

has super-classes
named photon energy ranges c

IXSc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#IXS

Inelastic X-ray Scattering (IXS) measures the energy and momentum change of X-rays scattered inelastically by a sample, providing information on electronic excitations, phonons, and other dynamic processes at the atomic scale.
has super-classes
experimental technique c

KESc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#KES

K-edge Subtraction Imaging (KES) measures transmitted X-ray intensity across photon energies around the absorption edge of a specific element, producing element-selective 2D maps that reveal its spatial distribution in the sample.
is equivalent to
experimental technique c and (measures as a function of op some Pa N E T01106 c) and (measures as a function of op some detection as a function of limited number of incident energies c) and (measures result of interaction op some transmission c)

KESCTc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#KESCT

K-edge Subtraction Tomography (KESCT) measures transmitted X-rays across the absorption edge of a target element at multiple projection angles to reconstruct 3D maps of elemental concentrations with high chemical specificity.
is equivalent to
experimental technique c and (measures as a function of op some detection as a function of limited number of incident energies c) and (measures as a function of op some tomography c) and (measures result of interaction op some transmission c) and (requires sample input op some x ray c)

laminographyc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#laminography

Many images of the sample under different orientations from which a 3D volume can be reconstructed. The rotation axis is titled with respect to the primary beam.
has super-classes
tomography c

large length scalesc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#large_length_scales

Length Scale d (Å) = 10 – 1000 Q-Range (Å−1) = 0.01 – 0.1 Large structural features: supramolecular structures, particle sizes, and shapes
has super-classes
detection resolution c

laserc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#laser

has super-classes
sample input c

LDDC-XASc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#LDDS-XAS

Laser-Driven Dynamic Compression X-ray Absorption Spectroscopy (LDDC-XAS) measures X-ray absorption spectra of materials compressed by laser-driven dynamic pressure pulses, providing time-resolved insights into electronic and structural changes under extreme conditions.
is equivalent to
experimental technique c and (measures as a function of op some detection as a function of incident energy c) and (measures as a function of op some sample compression c) and (measures interaction result property op some photon count c) and (measures result of interaction op some atomic core excitation c) and (requires sample input op some laser c) and (requires sample input op some x ray c)

LDSC-XASc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#LDSC-XAS

Laser-Driven Shock Compression X-ray Absorption Spectroscopy (LDSC-XAS) is a specific type of Laser-Driven Dynamic Compression X-ray Absorption Spectroscopy (LDDC-XAS) that measures X-ray absorption spectra of materials subjected to laser-driven shock waves, capturing rapid structural and electronic changes during high-strain-rate compression.
is equivalent to
experimental technique c and (measures as a function of op some detection as a function of incident energy c) and (measures as a function of op some shock compression c) and (measures interaction result property op some photon count c) and (measures result of interaction op some atomic core excitation c) and (requires sample input op some laser c) and (requires sample input op some x ray c)

left circular polarizationc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#left_circular_polarization

has super-classes
polarization c

low overpressurec back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#low_overpressure

1 × 10⁵ – 1 × 10⁷ Pa
has super-classes
sample pressure c

low temperaturec back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#low_temperature

77 – 300 K
has super-classes
sample temperature c

low vacuumc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#low_vacuum

100 – 1 × 10⁵ Pa
has super-classes
sample pressure c

macro sample spatial resolutionc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#macro_sample_spatial_resolution

Sample properties are measured with a resolution in space greater than 100 micron.
has super-classes
sample spatial resolution c

MACRO-XRFc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#MACRO-XRF

XRF which provides elemental distributions in a 2D projection of the sample in space. The spatial separation is achieved by moving the sample through a beam sized according to macro spacial resolution.
is equivalent to
experimental technique c and (measures as a function of op some macro sample spatial resolution c) and (measures as a function of op some scanning imaging c) and (measures interaction result property op some photon count c) and (measures interaction result property op some photon energy c) and (measures result of interaction op some fluorescence c) and (requires sample input op some x ray c)

MADc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#MAD

Multi-wavelength Anomalous Dispersion (MAD) measures diffraction at multiple X-ray wavelengths around an absorption edge to use anomalous scattering differences for more accurate phase determination in crystallography.
has super-classes
experimental technique c

magnetic fieldc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#magnetic_field

has super-classes
sample input c

MBSc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#MBS

Mössbauer spectroscopy measures the resonant absorption of X-rays by atomic nuclei in a solid to derive information on oxidation state, magnetic properties, and local chemical environment of Mössbauer-active isotopes (e.g. Fe-57).
has super-classes
experimental technique c

medium vacuumc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#medium_vacuum

1 × 10⁻³ – 100 Pa
has super-classes
sample pressure c

micro sample spatial resolutionc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#micro_sample_spatial_resolution

Sample properties are measured with a resolution in space between 0.5 and 500 micron.
has super-classes
sample spatial resolution c

MICRO-XRDc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#MICRO-XRD

XRD which provides small-scale feature or phase distributions in a 2D projection of the sample in space. The spatial separation is achieved by moving the sample through a beam sized according to micro spatial resolution.
is equivalent to
experimental technique c and (measures as a function of op some micro sample spatial resolution c) and (measures as a function of op some scanning imaging c) and (measures result of interaction op some diffraction of elastic scattering c) and (requires sample input op some x ray c)

MICRO-XRFc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#MICRO-XRF

XRF which provides elemental distributions in a 2D projection of the sample in space. The spatial separation is achieved by moving the sample through a beam sized according to micro spatial resolution.
is equivalent to
experimental technique c and (measures as a function of op some micro sample spatial resolution c) and (measures as a function of op some scanning imaging c) and (measures interaction result property op some photon count c) and (measures interaction result property op some photon energy c) and (measures result of interaction op some fluorescence c) and (requires sample input op some x ray c)

moderately high temperaturec back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#moderately_high_temperature

300 – 1,000 K
has super-classes
sample temperature c

monochromatic beamc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#monochromatic_beam

Photon energy bandwidth is smaller than ???
has super-classes
photon energy bandwidth c

MPESc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#MPES

Momentum-Resolved Photoemission Spectroscopy (MPES) measures electron emission as a function of momentum and energy to reveal the dispersion and symmetry of electronic states in solids.
has super-classes
experimental technique c

MRTc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#MRT

Microbeam Radiation Therapy (MRT) uses arrays of microscale, high-dose X-ray beams to irradiate tissue with high spatial precision, aiming to maximize tumor damage while sparing surrounding healthy tissue.
has super-classes
experimental technique c

multi sample spatial resolutionc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#multi_sample_spatial_resolution

Detect at different resolutions.
has super-classes
sample spatial resolution c

MXc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#MX

Macromolecular Crystallography (MX) measures X-ray diffraction from crystals of biological macromolecules to determine their 3D atomic structures, providing insights into protein folding, function, and interactions.
has super-classes
experimental technique c

named photon energy rangesc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#named_photon_energy_ranges

has super-classes
sample input c
has sub-classes
U V c, hard x ray c, infrared c, soft x ray c, visual spectrum c, x ray c

nano sample spatial resolutionc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#nano_sample_spatial_resolution

Sample properties are measured with a resolution in space between 0.5 and 500 nanometer.
has super-classes
sample spatial resolution c

NANO-XRDc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#NANO-XRD

XRD which provides small-scale feature or phase distributions in a 2D projection of the sample in space. The spatial separation is achieved by moving the sample through a beam sized according to nano spatial resolution.
is equivalent to
experimental technique c and (measures as a function of op some nano sample spatial resolution c) and (measures as a function of op some scanning imaging c) and (measures result of interaction op some diffraction of elastic scattering c) and (requires sample input op some x ray c)

NANO-XRFc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#NANO-XRF

XRF which provides elemental distributions in a 2D projection of the sample in space. The spatial separation is achieved by moving the sample through a beam sized according to nano sample spatial resolution.
is equivalent to
experimental technique c and (measures as a function of op some nano sample spatial resolution c) and (measures as a function of op some scanning imaging c) and (measures interaction result property op some photon count c) and (measures interaction result property op some photon energy c) and (measures result of interaction op some fluorescence c) and (requires sample input op some x ray c)

near edgec back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#near_edge

Incident energy is scanned of a range <200 eV
has super-classes
detection as a function of incident energy c

NFPc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#NFP

Near-Field Ptychography (NFP) measures coherent diffraction patterns collected in the near-field regime by scanning overlapping illumination spots, enabling high-resolution phase and amplitude imaging of samples.
has super-classes
experimental technique c

NFSc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#NFS

Nuclear Forward Scattering (NFS) measures the time-resolved resonant scattering of synchrotron-generated X-rays in the forward direction, extracting hyperfine parameters (e.g. isomer shift, quadrupole splitting, magnetic splitting) from the temporal interference pattern.
has super-classes
experimental technique c

NR-XMLDc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#NR-XMLD

Non-Reciprocal X-ray Magnetic Linear Dichroism (NR-XMLD) measures differences in linear X-ray absorption depending on magnetization direction and X-ray polarization, revealing magnetic asymmetries that break time-reversal symmetry.
has super-classes
experimental technique c

NRIXSc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#NRIXS

Nuclear Resonant Inelastic X-ray Scattering (NRIXS) measures the energy distribution of X-rays scattered inelastically by nuclear resonances, providing element-specific information on phonon density of states and lattice dynamics.
has super-classes
experimental technique c

NRSc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#NRS

Nuclear Resonant Scattering (NRS) measures time-delayed resonant scattering of X-rays from Mössbauer-active nuclei to study hyperfine interactions, magnetic order, and dynamics at the atomic scale.
has super-classes
experimental technique c

PB-XPCIc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#PB-XPCI

Propagation-Based X-ray Phase-Contrast Imaging (PB-XPCI) measures phase-induced interference fringes that form as X-rays propagate beyond a sample, producing 2D images with enhanced contrast for weakly absorbing or low-Z materials. By placing the detector at a sufficient distance from the sample, PB-XPCI converts subtle phase variations into measurable intensity modulations, revealing fine internal features and interfaces not visible in conventional absorption imaging.
is equivalent to
experimental technique c and (measures as a function of op some Pa N E T01106 c) and (measures result of interaction op some refraction c) and (measures result of interaction op some transmission c) and (requires sample input op some x ray c) and (requires sample input property op some unmodified beam c)

PB-XPCTc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#PB-XPCT

X-ray Propagation Phase-Contrast Tomography (PB-XPCT) measures phase-induced interference patterns that form as X-rays propagate beyond the sample, reconstructing 3D phase-contrast images by recording projections at sufficient sample–detector distances.
is equivalent to
experimental technique c and (measures as a function of op some tomography c) and (measures result of interaction op some refraction c) and (measures result of interaction op some transmission c) and (requires sample input op some x ray c) and (requires sample input property op some unmodified beam c)

PCIc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#PCI

Phase-Contrast X-ray Imaging (PCI) measures phase shifts of X-rays transmitted through a sample to generate 2D images with enhanced contrast for weakly absorbing or low-Z materials. By exploiting phase variations rather than absorption, PCI reveals fine structural details such as internal boundaries, fibers, and low-density regions that are invisible in conventional absorption-based X-ray imaging.
is equivalent to
experimental technique c and (measures as a function of op some Pa N E T01106 c) and (measures result of interaction op some refraction c) and (requires sample input op some x ray c)

PDFc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#PDF

Pair Distribution Function (PDF) analysis measures the distribution of interatomic distances by Fourier-transforming total scattering data, revealing local atomic arrangements and disorder in both crystalline and amorphous materials.
has super-classes
experimental technique c

PFY-XASc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#PFY-XAS

Partial Fluorescence Yield X-ray Absorption Spectroscopy (PFY-XAS) measures fluorescence photons from specific emission lines as a function of incident X-ray energy, providing element- and site-selective absorption spectra with reduced self-absorption effects.
is equivalent to
experimental technique c and (measures as a function of op some detection as a function of incident energy c) and (measures interaction result property op some photon count c) and (measures result of interaction op some atomic core excitation c) and (measures result of interaction op some fluorescence c) and (requires sample input op some x ray c)

photo electronsc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#photo_electrons

Detecting one result after atomic core excitation (photo electrons)
has super-classes
cascade of events being detected c

photon countc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#photon_count

has super-classes
detected photon property c
has members
example photon count ni

photon direction with respect to primary beamc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#photon_direction_with_respect_to_primary_beam

Not sure we need this. This was XRPD (angular dispersive) vs. ED-XRPD (energy dispersive).
has super-classes
detected photon property c

photon energyc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#photon_energy

Counting photons and their energy by semiconductors
has super-classes
detected photon property c

photon energy bandwidthc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#photon_energy_bandwidth

has super-classes
sample input c
has sub-classes
monochromatic beam c, pink beam c, white beam c

pink beamc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#pink_beam

Photon energy bandwidth is between ???
has super-classes
photon energy bandwidth c

PIXEc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#PIXE

Particle Induced X-ray Emission (PIXE) measures characteristic X-rays emitted by a sample when irradiated with energetic charged particles (e.g., protons) to determine elemental composition with high sensitivity.
is equivalent to
experimental technique c and (measures interaction result property op some photon count c) and (measures interaction result property op some photon energy c) and (measures result of interaction op some fluorescence c) and (requires sample input op some charged particles c)

point detectorc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#point_detector

Detector that cannot distinguish the position of the waves (photons or particles) in space.
has super-classes
detector type c

polarizationc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#polarization

has super-classes
detected photon property c
has sub-classes
horizontal linear polarization c, left circular polarization c, right circular polarization c, vertical linear polarization c

polycrystalline samplec back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#polycrystalline_sample

A polycrystalline material is composed of many small single crystals (grains) with different orientations joined together.
has super-classes
sample type c

powder samplec back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#powder_sample

A powder is a collection of tiny, separate crystalline particles with random orientations.
has super-classes
sample type c

primary beam modificationc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#primary_beam_modification

has super-classes
sample input property c
has sub-classes
grating c, speckle pattern c, unmodified beam c

PTYCHOc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#PTYCHO

Ptychography (PTYCHO) measures coherent diffraction patterns by scanning overlapping illumination spots on a sample in the far field, reconstructing high-resolution complex-valued images of sample structure beyond conventional lens limitations.
has super-classes
experimental technique c

PXCTc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#PXCT

Ptychographic X-ray Computed Tomography (PXCT) combines coherent diffraction imaging and tomography by scanning overlapping regions at multiple angles to reconstruct 3D quantitative electron density maps with nanometer-scale resolution.
has super-classes
experimental technique c

ramp compressionc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#ramp_compression

Lower strain rates (~10^3 to 10^6 s⁻¹)
has super-classes
sample compression c

reflectionc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#reflection

Detect waves (photons or particles) which are reflected of the interface between two media.
has super-classes
cascade of events being detected c

refractionc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#refraction

Detect waves (photons or particles) which are redirected as a result of passing from one medium to another.
has super-classes
cascade of events being detected c

REXSc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#REXS

Resonant Elastic X-ray Scattering (REXS) measures elastic scattering near an absorption edge to enhance contrast from specific elements, revealing electronic, magnetic, and orbital ordering in materials.
has super-classes
experimental technique c

right circular polarizationc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#right_circular_polarization

has super-classes
polarization c

RIXSc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#RIXS

Resonant Inelastic X-ray Scattering (RIXS) measures energy loss of X-rays scattered resonantly from a sample, providing detailed insights into electronic excitations, spin dynamics, and valence states.
has super-classes
experimental technique c

RXESc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#RXES

Resonant X-ray Emission Spectroscopy (RXES) measures emitted X-rays following resonant excitation of core electrons, providing element- and valence-specific information about electronic structure and chemical states.
has super-classes
experimental technique c

S-XEOLc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#S-XEOL

Scanning X-ray Excited Optical Luminescence (S-XEOL) measures spatially resolved optical emission induced by X-ray excitation by scanning a focused X-ray beam across a sample, providing 2D maps of luminescence associated with electronic and defect-related states.
has super-classes
experimental technique c

S-XRDc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#S-XRD

Scanning X-ray Diffraction (S-XRD) measures diffraction patterns at many scanned positions on a sample using a focused X-ray beam, providing spatially resolved 2D maps of crystal structure, phase distribution, and strain within the sample.
is equivalent to
experimental technique c and (measures as a function of op some scanning imaging c) and (measures result of interaction op some diffraction of elastic scattering c) and (requires sample input op some x ray c)
has super-classes
experimental technique c

S-XRFc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#S-XRF

Scanning X-ray Fluorescence (S-XRF) measures elemental composition by scanning a focused X-ray beam across a sample and detecting emitted fluorescence, producing high-resolution 2D maps of elemental distributions in the sample.
is equivalent to
experimental technique c and (measures as a function of op some scanning imaging c) and (measures interaction result property op some photon count c) and (measures interaction result property op some photon energy c) and (measures result of interaction op some fluorescence c) and (requires sample input op some x ray c)

SADc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#SAD

Single-wavelength Anomalous Diffraction (SAD) measures diffraction at one specific X-ray wavelength near an absorption edge to exploit anomalous scattering for phase determination in crystallography.
has super-classes
experimental technique c

sample compressionc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#sample_compression

has super-classes
space time c
has sub-classes
ramp compression c, shock compression c

sample incident anglec back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#sample_incident_angle

The angle between the incident wave (photons or particles) and the sample surface.
has super-classes
sample input property c
has sub-classes
sample incident angle smaller than critical angle c

sample incident angle smaller than critical anglec back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#sample_incident_angle_smaller_than_critical_angle

The angle between the incident wave (photons or particles) and the sample surface is below the critical angle for reflection.
has super-classes
sample incident angle c

sample inputc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#sample_input

Everything that influences the sample during an experiment.
has super-classes
technique property c
has sub-classes
D A C c, charged particles c, electrons c, laser c, magnetic field c, named photon energy ranges c, photon energy bandwidth c
is in range of
requires sample input op
is disjoint with
cascade of events being detected c, detected cascade of events property c, detector type c, sample input property c, sample type c, space time c

sample input propertyc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#sample_input_property

Properties of everything that influences the sample during an experiment.
has super-classes
technique property c
has sub-classes
disperse incident energy in space c, primary beam modification c, sample incident angle c, sample pressure c, sample temperature c
is in range of
requires sample input property op
is disjoint with
cascade of events being detected c, detected cascade of events property c, detector type c, sample input c, sample type c, space time c

sample pressurec back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#sample_pressure

has super-classes
sample input property c
has sub-classes
atmospheric pressure c, extreme high vacuum c, extreme pressure c, high pressure c, high vacuum c, low overpressure c, low vacuum c, medium vacuum c, ultra high vacuum c, very high pressure c

sample spatial resolutionc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#sample_spatial_resolution

Sample properties are measured with a resolution in space.
has super-classes
space time c
has sub-classes
macro sample spatial resolution c, micro sample spatial resolution c, multi sample spatial resolution c, nano sample spatial resolution c, sample spatial resolution achieved on detection c, sample spatial resolution achieved on input c

sample spatial resolution achieved on detectionc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#sample_spatial_resolution_achieved_on_detection

Sample properties are measured with a resolution in space determined by the detection mechanism (e.g. detector resolution or beam size).
has super-classes
sample spatial resolution c

sample spatial resolution achieved on inputc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#sample_spatial_resolution_achieved_on_input

Sample properties are measured with a resolution in space determined by the sample input.
has super-classes
sample spatial resolution c

sample temperaturec back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#sample_temperature

has super-classes
sample input property c
has sub-classes
ambient temperature c, cryogenic temperature c, extreme temperature c, high temperature c, low temperature c, moderately high temperature c, ultra cryogenic temperature c, ultra extreme temperature c, very high temperature c

sample typec back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#sample_type

Charateristics of the sample being investigated.
has super-classes
technique property c
has sub-classes
biological sample c, chemical solution c, polycrystalline sample c, powder sample c, single crystal sample c
is in range of
requires sample type op
is disjoint with
cascade of events being detected c, detected cascade of events property c, detector type c, sample input c, sample input property c, space time c

SAXSc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#SAXS

Small-Angle X-ray Scattering (SAXS) measures the X-ray scattering intensity at small angles to obtain information about the size, shape, and structural organization of nanoscale features in a sample.
is equivalent to
experimental technique c and (measures interaction result property op some large length scales c) and (measures result of interaction op some diffraction of elastic scattering c) and (requires sample input op some x ray c)

scanning imagingc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#scanning_imaging

Image of the sample build up by many measurements (motion of beam, sample or detector)
has super-classes
imaging c

SCXRDc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#SCXRD

Single Crystal X-ray Diffraction (SCXRD) measures X-ray diffraction from a single crystal to determine its precise 3D crystal structure, including atomic positions, bonding, and symmetry.
is equivalent to
experimental technique c and (measures result of interaction op some diffraction of elastic scattering c) and (requires sample input op some x ray c) and (requires sample type op some single crystal sample c)

serial screeningc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#serial_screening

A method of data collection where many samples of the same kind are streaming through the sample input (e.g. X-ray beam), one at a time. Measuring only one does not provide enough data that can be analyzed, you need many.
has super-classes
space time c

shock compressionc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#shock_compression

High strain rates (~10^6 to 10^9 s⁻¹).
has super-classes
sample compression c

simultanious referencec back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#simultanious_reference

Detect a reference compound or primary beam profile at the same time as measuring the actual sample.
has super-classes
space time c

single crystal samplec back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#single_crystal_sample

A solid material in which the component atoms are arranged in a definite pattern and whose surface regularity reflects its internal symmetry.
has super-classes
sample type c

SIXESc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#SIXES

Selectively Induced X-ray Emission Spectroscopy (SIXES) measures element- and state-specific X-ray emission by selectively exciting particular electronic states, recording a limited number of scanning X-ray fluorescence (S-XRF) maps at selected incident energies. This approach provides detailed insights into the electronic structure and chemical environment of complex materials while reducing data volume compared to full XANES mapping.
is equivalent to
experimental technique c and (measures as a function of op some detection as a function of limited number of incident energies c) and (measures as a function of op some scanning imaging c) and (measures interaction result property op some photon count c) and (measures interaction result property op some photon energy c) and (measures result of interaction op some atomic core excitation c) and (measures result of interaction op some fluorescence c) and (requires sample input op some x ray c)

small length scalesc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#small_length_scales

Length Scale d (Å) = 1 – 10 Q-Range (Å−1) = 0.1 – 2.5 Small structural features: Atomic distances, crystal lattice spacings, molecular packing
has super-classes
detection resolution c

SMSc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#SMS

The Synchrotron Mössbauer Source (SMS) provides a highly collimated, monochromatic beam of resonant X-rays (e.g. 14.4 keV for Fe-57), enabling Mössbauer spectroscopy with high spatial resolution, fast time resolution, and compatibility with micro- and nano-focused X-ray techniques.
has super-classes
experimental technique c

SMXc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#SMX

Serial Macromolecular Crystallography (SMX) is a subset of SSX focused on collecting diffraction data from many small macromolecular crystals, allowing high-resolution structural analysis of proteins and complexes that are challenging to crystallize.
has super-classes
experimental technique c

soft x rayc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#soft_x-ray

is equivalent to
named photon energy ranges c and (has energy range value dp some ) and (has energy range unit dp value eV)
has super-classes
named photon energy ranges c

speckle patternc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#speckle_pattern

X-ray beam goes through a structured material (e.g. sandpaper).
has super-classes
primary beam modification c

SSXc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#SSX

Serial Synchrotron Crystallography (SSX) is similar to Single Crystal X-ray Diffraction (SCXRD), but instead of measuring diffraction from one crystal in multiple orientations, SSX collects diffraction from many micro- or nano-crystals with random orientations sequentially at a synchrotron, enabling structure determination from samples that cannot grow large single crystals.
is equivalent to
experimental technique c and (measures as a function of op some serial screening c) and (measures result of interaction op some diffraction of elastic scattering c) and (requires sample input op some x ray c)

strip detectorc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#strip_detector

Detector that distinguishes the position of the waves (photons or particles) in a 1D strip (line with a certain thickness) in space by using an array of pixels which measure the waves independently.
has super-classes
detector type c

STXMc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#STXM

Scanning Transmission X-ray Microscopy (STXM) measures X-ray transmission through a sample by scanning a focused X-ray beam in 2D, providing spatially resolved chemical, elemental, and morphological maps at nanometer-scale resolution.
has super-classes
experimental technique c

technique propertyc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#technique_property

A characteristic or feature that describes what an experimental technique can do, how it works, or what kind of information it provides (like resolution, sensitivity, or the type of data it collects).
has sub-classes
cascade of events being detected c, detected cascade of events property c, detector type c, sample input c, sample input property c, sample type c, space time c

TEMc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#TEM

Transmission Electron Microscopy (TEM) measures electrons transmitted through an ultra-thin sample to produce high-resolution images of its internal structure, enabling atomic- to nanometer-scale imaging and analysis of morphology, crystallography, and defects.
is equivalent to
experimental technique c and (measures result of interaction op some transmission c) and (requires sample input op some electrons c)

TFY-XASc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#TFY-XAS

Total Fluorescence Yield X-ray Absorption Spectroscopy (TFY-XAS) measures the total emitted fluorescence photons as a function of incident X-ray energy to determine element-specific absorption spectra, providing bulk-sensitive information about electronic and structural properties.
is equivalent to
experimental technique c and (measures as a function of op some detection as a function of incident energy c) and (measures interaction result property op some photon count c) and (measures result of interaction op some atomic core excitation c) and (measures result of interaction op some fluorescence c) and (requires sample input op some x ray c)

tomographyc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#tomography

Many images of the sample under different orientations from which a 3D volume can be reconstructed
has super-classes
space time c
has sub-classes
laminography c

total electronsc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#total_electrons

Detecting electron results after atomic core excitation (photo-electrons or auger-electrons)
is equivalent to
auger electrons c or photo electrons c
has super-classes
cascade of events being detected c

TR-MXc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#TR-MX

Time-Resolved Macromolecular Crystallography (TR-MX) measures X-ray diffraction from macromolecular crystals at successive time points following a reaction trigger (e.g., laser pulse or substrate injection), enabling the observation of structural changes in biomolecules during a reaction or functional cycle.
has super-classes
experimental technique c

TR-SSXc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#TR-SSX

Time-Resolved Serial Synchrotron Crystallography (TR-SSX) measures time-dependent diffraction from a sequence of micro- or nano-crystals, each at a slightly different time-delay after reaction initiation. By combining pump–probe triggering (e.g., laser or mix-and-inject) with high-speed fixed-target delivery and fast detectors, TR-SSX enables the reconstruction of 3D “molecular movies” that reveal structural changes in biomolecules under physiological conditions at microsecond to millisecond resolution.
has super-classes
experimental technique c

TR-USAXSc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#TR-USAXS

Time-Resolved Ultra-Small Angle X-ray Scattering (TR-USAXS) measures ultra-small angle X-ray scattering as a function of time to monitor structural evolution and dynamics of large-scale features such as aggregation, phase separation, or self-assembly.
has super-classes
experimental technique c

TR-XRDc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#TR-XRD

Time-Resolved X-ray Diffraction (TR-XRD) measures changes in X-ray diffraction patterns as a function of time to study dynamic processes such as phase transitions, chemical reactions, and structural changes in materials.
has super-classes
experimental technique c

TR-XSSc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#TR-XSS

Time-Resolved X-ray Solution Scattering (TR-XSS) measures transient changes in X-ray scattering from a solution of chemicals or biomolecules following a triggering perturbation, providing insights into the dynamics of structural rearrangements of the solute and of the surrounding solvent.
is equivalent to
experimental technique c and (measures as a function of op some detection as a function of time c) and (measures result of interaction op some diffraction of elastic scattering c) and (requires sample input op some x ray c) and (requires sample type op some chemical solution c)

transmissionc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#transmission

Detect incident photon or particles after passing through the sample without interaction
has super-classes
cascade of events being detected c
is in domain of
measures transmission with detector type op

TXRFc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#TXRF

Total Reflection X-ray Fluorescence (TXRF) measures characteristic X-rays emitted by a sample under total external reflection conditions, providing highly sensitive, surface-specific elemental analysis with minimal sample preparation.
is equivalent to
experimental technique c and (measures interaction result property op some photon count c) and (measures interaction result property op some photon energy c) and (measures result of interaction op some fluorescence c) and (requires sample input op some x ray c) and (requires sample input property op some sample incident angle smaller than critical angle c)

U Vc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#UV

has super-classes
named photon energy ranges c

ultra cryogenic temperaturec back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#ultra_cryogenic_temperature

< 1 K
has super-classes
sample temperature c

ultra extreme temperaturec back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#ultra_extreme_temperature

> 10⁷ K
has super-classes
sample temperature c

ultra high vacuumc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#ultra_high_vacuum

1 × 10⁻¹⁰ – 1 × 10⁻⁷ Pa
has super-classes
sample pressure c

ultra large length scalesc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#ultra_large_length_scales

Length Scale d (Å) = 1000 - 10000 Q-Range (Å−1) = 0.0001 - 0.01 Ultra Large structural features: large aggregates, clusters, and larger pores
has super-classes
detection resolution c

unmodified beamc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#unmodified_beam

has super-classes
primary beam modification c

USA-XPCSc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#USA-XPCS

Ultra-Small Angle X-ray Photon Correlation Spectroscopy (USA-XPCS) measures time-dependent fluctuations of coherent X-ray scattering at ultra-small angles to probe slow dynamics and structural rearrangements on large length scales in complex materials.
has super-classes
experimental technique c

USAXSc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#USAXS

Ultra-Small Angle X-ray Scattering (USAXS) measures X-ray scattering at extremely small angles to probe structural features on length scales larger than those accessible by SAXS, such as large-scale aggregates, pores, or hierarchical structures.
is equivalent to
experimental technique c and (measures interaction result property op some ultra large length scales c) and (measures result of interaction op some diffraction of elastic scattering c) and (requires sample input op some x ray c)

vertical linear polarizationc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#vertical_linear_polarization

has super-classes
polarization c

very high pressurec back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#very_high_pressure

1 × 10⁹ – 1 × 10¹¹ Pa
has super-classes
sample pressure c

very high temperaturec back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#very_high_temperature

2,000 – 5,000 K
has super-classes
sample temperature c

visual spectrumc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#visual_spectrum

has super-classes
named photon energy ranges c

VLMc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#VLM

Visible Light Microscopy (VLM) captures images of a sample using visible light illumination and optical lenses, providing spatially resolved information about surface morphology, color, and structure at micrometer-scale resolution.
is equivalent to
experimental technique c and (measures as a function of op some full field imaging c) and (measures as a function of op some micro sample spatial resolution c) and (requires sample input op some visual spectrum c)

wavelength dispersive detectorc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#wavelength_dispersive_detector

Detector that distinguishes the energy of the waves (photons or particles) it measures with a crystal monochromator which separates the energies in space.
has super-classes
detector type c

WAXSc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#WAXS

Wide-Angle X-ray Scattering (WAXS) measures X-ray scattering at larger angles than SAXS to provide information on short-range order, crystalline structure, and molecular packing in materials.
is equivalent to
experimental technique c and (measures interaction result property op some small length scales c) and (measures result of interaction op some diffraction of elastic scattering c) and (requires sample input op some x ray c)

WDSc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#WDS

WDS measures X-ray photons coming from a sample during irradiation with a wavelength dispersive detector and derives elemental composition from the energy of the fluorescence photons
is equivalent to
experimental technique c and (measures interaction result property op some photon count c) and (measures interaction result property op some photon energy c) and (measures result of interaction op some fluorescence c) and (measures with a detector type op some wavelength dispersive detector c) and (requires sample input op some x ray c)

white beamc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#white_beam

Photon energy bandwidth is greater than ???
has super-classes
photon energy bandwidth c

x rayc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#x-ray

has super-classes
named photon energy ranges c

XACTc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#XACT

X-ray Absorption Tomography measures X-ray attenuation through a sample from multiple projection angles and reconstructs a 3D map of the absorption coefficient, revealing internal density variations within the material.
is equivalent to
experimental technique c and (measures as a function of op some tomography c) and (measures result of interaction op some transmission c) and (requires sample input op some x ray c)

XANESc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#XANES

XANES (X-ray Absorption Near Edge Structure) measures the fine structure in X-ray absorption near an element’s absorption edge, providing information about the oxidation state, electronic structure, and coordination geometry of the absorbing atoms.
is equivalent to
experimental technique c and (measures as a function of op some near edge c) and (measures interaction result property op some photon count c) and (measures result of interaction op some atomic core excitation c) and (requires sample input op some x ray c)

XAPCTc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#XAPCT

X-ray Analyzer-Based Phase-Contrast Tomography (XAPCT) measures angular deviations of X-rays transmitted through a sample using a crystal analyzer to map phase gradients, providing 3D images with high contrast for interfaces and internal structures.
is equivalent to
experimental technique c and (measures as a function of op some tomography c) and (measures result of interaction op some diffraction of elastic scattering c) and (measures result of interaction op some diffusion c) and (measures result of interaction op some refraction c) and (measures result of interaction op some transmission c) and (measures with a detector type op some analyzer crystal c) and (requires sample input op some monochromatic beam c) and (requires sample input op some x ray c)

XASc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#XAS

XAS measures a signal related to the X-ray absorption probability—such as fluorescence, photon electrons, Auger electrons, or transmission—as a function of the incident X-ray photon energy. It probes atomic core-level excitations by removing core-shell electrons, providing element-specific information about the local chemical environment, oxidation state, and atomic structure around the absorbing atoms.
is equivalent to
experimental technique c and (measures as a function of op some detection as a function of incident energy c) and (measures interaction result property op some photon count c) and (measures result of interaction op some atomic core excitation c) and (requires sample input op some x ray c)

XBHc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#XBH

X-ray Bragg Holography (XBH) measures interference patterns formed by Bragg-diffracted and reference X-rays from a crystal to reconstruct 3D atomic-scale images of the crystal structure.
has super-classes
experimental technique c

XCLc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#XCL

X-ray Computed Laminography (XCL) measures the interaction of X-rays with flat or extended samples (through absorption, phase, or scattering contrast) at multiple tilted angles to reconstruct 3D images of internal structures that are difficult to access with conventional tomography due to sample geometry.
is equivalent to
experimental technique c and (measures as a function of op some laminography c) and (requires sample input op some x ray c)

XDMRc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#XDMR

X-ray Detected Magnetic Resonance (XDMR) measures changes in X-ray absorption or emission induced by magnetic resonance excitation, providing element-specific information on spin dynamics and magnetic excitations.
has super-classes
experimental technique c

XDSc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#XDS

X-ray Diffuse Scattering (XDS) measures scattered X-rays away from Bragg peaks to probe local disorder, defects, thermal vibrations, and nanoscale structural fluctuations in materials.
has super-classes
experimental technique c

XEOLc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#XEOL

X-ray Excited Optical Luminescence (XEOL) measures visible or near-visible light emitted from a sample after X-ray excitation, providing information on electronic structure, defect states, and luminescent centers.
has super-classes
experimental technique c

XESc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#XES

X-ray Emission Spectroscopy (XES) measures emitted X-ray photons from electronic transitions after X-ray excitation, revealing detailed information about the electronic structure and chemical state of elements. Unlike XRF, which identifies elemental composition through broad characteristic fluorescence lines, XES uses high energy resolution to resolve fine spectral features—such as valence-to-core transitions—providing deeper insight into the local chemical bonding and electronic environment.
has super-classes
experimental technique c

XFCTc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#XFCT

X-ray Fluorescence Tomography (XFCT) measures characteristic fluorescence X-rays emitted from a sample at multiple angles to reconstruct 3D elemental distributions with high sensitivity and spatial resolution.
is equivalent to
experimental technique c and (measures as a function of op some tomography c) and (measures interaction result property op some photon count c) and (measures interaction result property op some photon energy c) and (measures result of interaction op some fluorescence c) and (requires sample input op some x ray c)

XFHc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#XFH

X-ray Fluorescence Holography (XFH) measures interference between fluorescent X-rays emitted from atoms and scattered reference waves to obtain 3D atomic-scale images of the local atomic arrangement around specific elements.
has super-classes
experimental technique c

XGIc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#XGI

X-ray Ghost Imaging (XGI) measures correlations between structured illumination patterns and total transmitted intensities to reconstruct 2D or 3D images without spatially resolved detection. Unlike speckle imaging, ghost imaging simultaneously records reference (without sample) and sample-affected signals using a beam splitter.
is equivalent to
experimental technique c and (measures as a function of op some Pa N E T01106 c) and (measures as a function of op some simultanious reference c) and (measures result of interaction op some diffusion c) and (measures result of interaction op some refraction c) and (measures result of interaction op some transmission c) and (requires sample input op some x ray c) and (requires sample input property op some speckle pattern c)
has super-classes
experimental technique c

XGPCTc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#XGPCT

X-ray Grating Phase-Contrast Tomography (XGPCT) measures X-ray phase shifts using an interferometric grating setup across multiple projection angles, providing 3D images with high sensitivity to small refractive index variations in soft or low-Z materials.
is equivalent to
experimental technique c and (measures as a function of op some tomography c) and (measures result of interaction op some diffusion c) and (measures result of interaction op some refraction c) and (measures result of interaction op some transmission c) and (requires sample input op some x ray c) and (requires sample input property op some grating c)

XHTc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#XHT

X-ray HoloTomography (XHT) combines holographic imaging and tomography by recording holograms at multiple sample–detector distances and projection angles to reconstruct 3D electron density maps with sub-micrometer resolution.
is equivalent to
experimental technique c and (measures as a function of op some detection as a function of limited number of sample to detector distance c) and (measures as a function of op some tomography c) and (measures result of interaction op some refraction c) and (measures result of interaction op some transmission c) and (requires sample input op some x ray c) and (requires sample input property op some unmodified beam c)

XLDc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#XLD

X-ray Linear Dichroism (XLD) measures the difference in X-ray absorption for linearly polarized light oriented along different crystallographic axes, providing information on electronic anisotropy and orbital ordering.
has super-classes
experimental technique c

XMCDc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#XMCD

X-ray Magnetic Circular Dichroism (XMCD) measures the difference in absorption of left- and right-circularly polarized X-rays in a magnetized sample, probing element-specific magnetic moments and spin states.
has super-classes
experimental technique c

XMLDc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#XMLD

X-ray Magnetic Linear Dichroism (XMLD) measures differences in X-ray absorption of linearly polarized light depending on magnetic order, sensitive to antiferromagnetic and magnetic domain structures.
has super-classes
experimental technique c

XMχDc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#XMχD

X-ray MagnetoChiral Dichroism (XMχD) measures differences in X-ray absorption related to the combined effects of magnetism and chirality in materials, revealing chiral magnetic structures.
has super-classes
experimental technique c

XNCDc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#XNCD

X-ray Natural Circular Dichroism (XNCD) measures differences in absorption of circularly polarized X-rays in non-magnetic chiral materials, providing information on structural chirality and electronic asymmetry.
has super-classes
experimental technique c

XNHTc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#XNHT

X-ray Nano-HoloTomography (XNHT) is a high-resolution variant of XHT that combines nanoscale focusing and holographic tomography to obtain 3D electron density maps of internal structure at nanometer resolution.
is equivalent to
experimental technique c and (measures as a function of op some detection as a function of limited number of sample to detector distance c) and (measures as a function of op some nano sample spatial resolution c) and (measures as a function of op some tomography c) and (measures result of interaction op some refraction c) and (measures result of interaction op some transmission c) and (requires sample input op some x ray c) and (requires sample input property op some unmodified beam c)

XPCIc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#XPCI

X-ray Phase-Contrast Imaging (XPCI) measures phase shifts of X-rays transmitted through a sample to enhance image contrast, enabling visualization of structures with low absorption contrast such as soft tissues or light materials.
has super-classes
experimental technique c

XPCSc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#XPCS

X-ray Photon Correlation Spectroscopy (XPCS) measures time fluctuations of coherent X-ray scattering intensity to probe nanoscale dynamics and temporal correlations in materials such as particle motion, phase transitions, or relaxation processes.
has super-classes
experimental technique c

XPCTc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#XPCT

X-ray Phase-Contrast Tomography (XPCT) measures phase shifts of X-rays passing through a sample from multiple angles to reconstruct 3D images with enhanced contrast for weakly absorbing materials, revealing internal structures invisible in conventional absorption tomography.
is equivalent to
experimental technique c and (measures as a function of op some tomography c) and (measures result of interaction op some refraction c) and (measures result of interaction op some transmission c) and (requires sample input op some x ray c)

XPSc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#XPS

X-ray Photoelectron Spectroscopy (XPS) measures the kinetic energy of electrons ejected by X-rays to determine elemental composition and chemical states near the surface of a material.
has super-classes
experimental technique c

XRAYSc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#XRAYS

Experimental techniques based on irradiating a sample with X-rays to probe its properties by measuring interactions such as absorption, scattering, fluorescence, or diffraction, providing insights into structural, elemental, or electronic characteristics depending on the specific method used.
is equivalent to
experimental technique c and (requires sample input op some x ray c)
has super-classes
experimental technique c

XRCTc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#XRCT

X-ray Computed Tomography (XRCT) measures the interaction of X-rays with a sample (through absorption, phase, or scattering contrast) from multiple angles to reconstruct a 3D volume, providing detailed internal structural information such as density, morphology, and defects.
is equivalent to
experimental technique c and (measures as a function of op some tomography c) and (requires sample input op some x ray c)

XRDc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#XRD

X-ray Diffraction (XRD) measures the diffraction pattern produced when X-rays interact with a crystalline sample. The pattern provides information about the crystal structure, phase identification, lattice parameters, and crystallite size of the material.
is equivalent to
experimental technique c and (measures result of interaction op some diffraction of elastic scattering c) and (requires sample input op some x ray c)

XRFc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#XRF

X-ray Fluorescence (XRF) measures characteristic X-ray photons emitted by a sample when it is irradiated with X-rays. The energy of the emitted fluorescence photons reveals the elemental composition and chemical state of the sample.
is equivalent to
experimental technique c and (measures interaction result property op some photon count c) and (measures interaction result property op some photon energy c) and (measures result of interaction op some fluorescence c) and (requires sample input op some x ray c)

XRPDc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#XRPD

X-ray Powder Diffraction (XRPD) measures diffraction patterns from polycrystalline or powdered samples to identify phases, determine crystal structure, lattice parameters, and quantify phase composition.
is equivalent to
experimental technique c and (measures result of interaction op some diffraction of elastic scattering c) and (requires sample input op some x ray c) and (requires sample type op some powder sample c)
has super-classes
experimental technique c

XRRc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#XRR

X-ray Reflectometry (XRR) measures the intensity of X-rays reflected from thin films or multilayers as a function of incident angle to determine film thickness, density, and interface roughness.
is equivalent to
experimental technique c and (measures result of interaction op some reflection c) and (requires sample input op some x ray c)

XRSc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#XRS

X-ray Raman Scattering (XRS) measures inelastic scattering of hard X-rays by core electrons, enabling the study of low-Z elements’ electronic structure and bonding in bulk samples without the need for soft X-rays or vacuum conditions.
has super-classes
experimental technique c

XRTc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#XRT

X-ray Diffraction Topography (XRT) records spatial variations in the intensity of X-ray diffraction from a crystal to image defects, dislocations, and strain fields with high spatial resolution, revealing crystal quality and internal microstructure.
has super-classes
experimental technique c

XSPCIc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#XSPCI

X-ray Speckle Phase-Contrast Imaging (XSPCI) measures phase shifts by analyzing distortions in speckle patterns produced by a random or structured diffuser, providing 2D images with both phase and dark-field contrast. The phase contrast enhances visibility of weakly absorbing features, while the dark-field signal quantifies sample (in)homogeneity within individual detector pixels.
is equivalent to
experimental technique c and (measures as a function of op some Pa N E T01106 c) and (measures result of interaction op some diffusion c) and (measures result of interaction op some refraction c) and (measures result of interaction op some transmission c) and (requires sample input op some x ray c) and (requires sample input property op some speckle pattern c)

XSPCTc back to ToC or Class ToC

IRI: https://w3id.org/PaN/ESRFET#XSPCT

X-ray Speckle Phase-Contrast Tomography (XSPCT) measures phase shifts by tracking speckle pattern distortions as the sample rotates, enabling 3D imaging of weakly absorbing materials and providing both phase and dark-field contrast, which is a measure for sample (in)homogeneity within one detector pixel.
is equivalent to
experimental technique c and (measures as a function of op some tomography c) and (measures result of interaction op some diffusion c) and (measures result of interaction op some refraction c) and (measures result of interaction op some transmission c) and (requires sample input op some x ray c) and (requires sample input property op some speckle pattern c)

Object Properties

measures as a function ofop back to ToC or Object Property ToC

IRI: https://w3id.org/PaN/ESRFET#measures_as_a_function_of

Example: XAS measures as function of incident X-ray photon energy X-ray absorption tomography measures as function of sample orientation Scanning Micro X-ray fluorescence measures as function of sample translation
has domain
experimental technique c
has range
space time c

measures interaction result propertyop back to ToC or Object Property ToC

IRI: https://w3id.org/PaN/ESRFET#measures_interaction_result_property

Example: XRF measures photon energy
has domain
experimental technique c
has range
detected cascade of events property c

measures result of interactionop back to ToC or Object Property ToC

IRI: https://w3id.org/PaN/ESRFET#measures_result_of_interaction

Example: XRF measures fluorscence
has domain
experimental technique c
has range
cascade of events being detected c

measures transmission with detector typeop back to ToC or Object Property ToC

IRI: https://w3id.org/PaN/ESRFET#measures_transmission_with_detector_type

has domain
transmission c
has range
detector type c

measures with a detector typeop back to ToC or Object Property ToC

IRI: https://w3id.org/PaN/ESRFET#measures_with_a_detector_type

has domain
experimental technique c
has range
detector type c

requires sample inputop back to ToC or Object Property ToC

IRI: https://w3id.org/PaN/ESRFET#requires_sample_input

Example: Soft X-ray Absorption Spectroscopy uses soft X-ray as sample input
has domain
experimental technique c
has range
sample input c

requires sample input propertyop back to ToC or Object Property ToC

IRI: https://w3id.org/PaN/ESRFET#requires_sample_input_property

has domain
experimental technique c
has range
sample input property c

requires sample typeop back to ToC or Object Property ToC

IRI: https://w3id.org/PaN/ESRFET#requires_sample_type

Example: XRPD requires powder XRD does not require any sample type Another way of looking at it: diffraction (cascade of events being detected) requires 'any of' single crystal, powder, fiber X-ray powder diffraction (technique) requires 'exactly' powder
has domain
experimental technique c
has range
sample type c

Data Properties

has energy range unitdp back to ToC or Data Property ToC

IRI: https://w3id.org/PaN/ESRFET#energy_range_unit

has range
string

has energy range valuedp back to ToC or Data Property ToC

IRI: https://w3id.org/PaN/ESRFET#energy_range_value

has range
float

Annotation Properties

abstractap back to ToC or Annotation Property ToC

IRI: http://purl.org/dc/terms/abstract

alt Labelap back to ToC or Annotation Property ToC

IRI: http://www.w3.org/2004/02/skos/core#altLabel

contributorap back to ToC or Annotation Property ToC

IRI: http://purl.org/dc/terms/contributor

createdap back to ToC or Annotation Property ToC

IRI: http://purl.org/dc/terms/created

creatorap back to ToC or Annotation Property ToC

IRI: http://purl.org/dc/terms/creator

licenseap back to ToC or Annotation Property ToC

IRI: http://purl.org/dc/terms/license

mboxap back to ToC or Annotation Property ToC

IRI: http://xmlns.com/foaf/0.1/mbox

modifiedap back to ToC or Annotation Property ToC

IRI: http://purl.org/dc/terms/modified

pref Labelap back to ToC or Annotation Property ToC

IRI: http://www.w3.org/2004/02/skos/core#prefLabel

preferred Namespace Prefixap back to ToC or Annotation Property ToC

IRI: http://purl.org/vocab/vann/preferredNamespacePrefix

preferred Namespace Uriap back to ToC or Annotation Property ToC

IRI: http://purl.org/vocab/vann/preferredNamespaceUri

titleap back to ToC or Annotation Property ToC

IRI: http://purl.org/dc/terms/title

Named Individuals

E S R Fni back to ToC or Named Individual ToC

IRI: https://w3id.org/PaN/ESRFET#ESRF

belongs to
Organization c
has facts
homepage ap http://www.esrf.fr ep
name ap "ESRF"

example photon countni back to ToC or Named Individual ToC

IRI: https://w3id.org/PaN/ESRFET#example_photon_count

belongs to
photon count c

person/ G Koumoutsosni back to ToC or Named Individual ToC

IRI: https://w3id.org/PaN/ESRFET#person/GKoumoutsos

belongs to
Person c
has facts
mbox ap "koumoutsosgian@yahoo.gr"^^Literal
name ap "Giannis Koumoutsos"

person/ L Brocheni back to ToC or Named Individual ToC

IRI: https://w3id.org/PaN/ESRFET#person/LBroche

belongs to
Person c
has facts
affiliation ap E S R F ni
mbox ap "dau-pydev@esrf.fr"
name ap "Ludovic Broche"

person/ M Bodinni back to ToC or Named Individual ToC

IRI: https://w3id.org/PaN/ESRFET#person/MBodin

belongs to
Person c
has facts
affiliation ap E S R F ni
mbox ap "dau-pydev@esrf.fr"
name ap "Marjolaine Bodin Ligeon"

person/ P O Autranni back to ToC or Named Individual ToC

IRI: https://w3id.org/PaN/ESRFET#person/POAutran

belongs to
Person c
has facts
affiliation ap E S R F ni
mbox ap "dau-pydev@esrf.fr"
name ap "Pierre-Olivier Autran"

person/ W De Nolfni back to ToC or Named Individual ToC

IRI: https://w3id.org/PaN/ESRFET#person/WDeNolf

belongs to
Person c
has facts
affiliation ap E S R F ni
mbox ap "dau-pydev@esrf.fr"^^Literal
name ap "Wout De Nolf"

wrongni back to ToC or Named Individual ToC

IRI: https://w3id.org/PaN/ESRFET#wrong

has facts
measures interaction result property op example photon count ni

Legend back to ToC

c: Classes
op: Object Properties
dp: Data Properties
ni: Named Individuals
ep: External Properties

References back to ToC

Add your references here. It is recommended to have them as a list.

Acknowledgments back to ToC

The authors would like to thank Silvio Peroni for developing LODE, a Live OWL Documentation Environment, which is used for representing the Cross Referencing Section of this document and Daniel Garijo for developing Widoco, the program used to create the template used in this documentation.